A method for locating failure nodes of FPGA interconnect circuits

LI Hang, KANG Hairong, CHEN Liuming, LIU Yi

MICROPROCESSORS ›› 2026, Vol. 47 ›› Issue (4) : 54-59.

PDF(1373 KB)
Welcome to visit MICROPROCESSORS!
PDF(1373 KB)
MICROPROCESSORS ›› 2026, Vol. 47 ›› Issue (4) : 54-59. DOI: 10.3969/j.issn.1002-2279.2026.04.008

A method for locating failure nodes of FPGA interconnect circuits

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

QR code of this article

Cite this article

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2026, 47(4): 54-59 https://doi.org/10.3969/j.issn.1002-2279.2026.04.008

References

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(1373 KB)

Accesses

Citation

Detail

Sections
Recommended

/

〈 〉